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bin-SENSE: Accelerated MRI Near Metal With No Additional Hardware

Author:Lee, Philip   Shi, Xinwei   Yoon, Daehyun   Levine, Evan   Hargreaves, Brian   

Author Institution:Stanford University  

Session Type:Electronic Poster  

Session Date:Tuesday, 19 June 2018  

Session Time:14:45  

Session:System Imperfections & Artifacts: Characterization & Correction  

Program Number:4220  

Presentation Time:

Room Number:Exhibition Hall  

Computer Number:Computer 70