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Visualizing the Role of Ideal Current Patterns in Minimizing Sample Noise Using Dark Mode Current Patterns for a Spherical Sample

Author:Manushka Vaidya Daniel Sodickson Christopher Collins Riccardo Lattanzi

Session Type:Electronic Poster

Session Date:Tuesday, 25 April 2017

Session Time:16:15

Session:RF Simulation & Design Strategies

Program Number:4280

Presentation Time:

Room Number:Exhibition Hall

Computer Number:Computer 97

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