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Dynamic Control of the First and Second Order Shim Coils by LabVIEW at 4T

EPI Artifact Correction in Electro-Mechanical Resonance Regimes

Estimation of Thermal Noise in the Presence of Artifacts in EPI Images

Gradient Switching Induced Artifacts Near Metal Parts

Improved Coverage and Fewer Artifacts Through Oversampling in Non-Cartesian Scans