Manuel Murbach1, Thomas Doering2, and Gregor Schaefers2,3
1Murbach EMConsulting, Zurich, Switzerland, 2MR:comp GmbH, Gelsenkirchen, Germany, 3MRI-STaR - Magnetic Resonance Institute for Safety, Technology and Research GmbH, Gelsenkirchen, Germany
Synopsis
This
study aims at exploring an alternative method (Tier 2.5) to estimate realistic
in vivo E-fields at implant locations by including the directivity and length
of the implants, which neglects non-relevant E-field components and too
localized averaging schemes. The latest revision of the ASTM standard F2182-19e2
requires establishing a relation of the temperature increase near a metallic
implant between A) the experimental measurement and B) the in vivo estimation
in a representative patient population. The usage of currently standardized
methods results in presumably overly conservative estimations, causing implant
labels to be up to a factor 10 more restrictive.
Introduction
Metallic
passive implants pose a significant health risk to the patient, when undergoing
MRI examination. The induced electric fields may be “collected” along the implant
and deposited at its endings, leading to very localized heating. Therefore,
several test methods describe how to assess the potential risk.
The latest
ASTM standard revision F2182-19e21 now states:
“The implant manufacturer is responsible for establishing the relationship
between ΔT for the implant
tested in the gelled-saline filled phantom and the ΔT
that is expected in the patient population under the specified exposure
conditions specified in the MR labeling” (Section §9.1). This includes at least
a comparison of 1) the implant exposure level (homogenous E-field in the test
phantom; very heterogeneous E-field in the patient), and 2) of the induced
temperature increase (tissue simulating non-perfused gel in the test phantom;
biological tissues in the patient with blood perfusion). This study aims at covering
1).
Standardized
estimation methods in vivo (ISO/TS 10974; Tier 2)2 result in
very high E-fields, which are presumably overly conservative and manyfold
higher (up to factor >3; factor >10 in power/temperature) than a typical
ASTM test E-field. One aim of this study is to evaluate representative E-Field
values from this Tier 2 evaluation, and to compare it to the ASTM field levels.
Realistic
and not overly conservative estimations are very challenging. The presented method
is including the directivity of the implant and its length. Both of which is
not considered in the standardized Tier 2 approach, where the total E-field is averaged
over 10g, and the cube-length result in a spatial averaging of approximately
22 mm. To cover the three dimensions of the implant, a set of
one-dimensional trajectories are introduced (Figure 1), estimating all possible
tangential E-field components the implant may be subjected to.Methods
The ASTM test E-field (approx. 120 V/m) is compared
to the in vivo E-field, where the peak E10g can exceed 500 V/m (Figure 3).
In the here proposed Tier 2.5 method,
multiple trajectories (Figure 1) are drawn to cover the incident E-fields of
the implant of interest. The tangential E-field is evaluated with the
standardized Tier 3 Method and averaged without phase information and without
using the transfer-function. 100 trajectories have been evaluated per implant,
including one implant with 1000 trajectories for sensitivity comparison.
Estimations are based on the MRIxViP library (IT’IS Foundation, Zurich,
Switzerland), and evaluated with the IMAnalytics framework (Zurich MedTech,
Zurich, Switzerland). All fields are normalized to the normal operating mode
and a maximum of 7 μT B1+rms at 1.5T, and 3.5 μT B1+rms at 3T, averaged on the axial
central slab according to the IEC standard3. The maximum B1+rms
is a hardware limit derived from ISO/TS2. A comparison of the Tier 2, Tier 2.5, and Tier 3 method is shown in
Figure 2.Results and Discussion
With the standardized Tier 2 method (which includes
a 95th percentile), preliminarily evaluated regions show up to >
300 V/m (Figure 4). In our here proposed method Tier 2.5, the two evaluated
implants (hip and knee) show an averaged E-field of around 100 – 150 V/m
(Figure 4). For
the corresponding knee and hip regions, Tier 2 evaluations showed >200 V/m,
which is a factor >1.6 higher than the ASTM test E-field, and a factor >2.8
higher in power/temperature. This means, that a given implant that has shown a
temperature increase of 6°C in ASTM testing would now have to be rated for a >17°C
increase, following §9.1 of ASTM. The estimation with Tier 2.5 shows E-field
levels comparable to the ASTM test E-field.Conclusions
The
proposed Tier 2.5 evaluation scheme for short passive implants may provide a
relevant estimate for the in vivo E-field, without being overly conservative. This
could serve as a practical approach to fulfill the in vivo comparison
requirement in the latest revision of the ASTM standard.
A
broad validation series with direct implant simulations will need to be
performed to confirm that the Tier 2.5 approach is conservatively covering the estimation
of the relevant E-field components for implant heating. The assessment will
include validating the assumption that phase effects are negligible for
relatively short implants in the MR exposure scenario, which has small
phase-shifts.Acknowledgements
No acknowledgement found.References
1. ASTM. F2182-19e2.
Standard Test Method for Measurement of Radio Frequency Induced Heating On or
Near Passive Implants During Magnetic Resonance. 2020.
2. ISO/TS. 10974:2018,
Assessment of the safety of magnetic resonance imaging for patients with an
active implantable medical device. ISO/TS 10974 2018.
3. IEC. Medical
electrical equipment - Part 2-33: Particular requirements for the basic safety
and essential performance of magnetic resonance equipment for medical
diagnosis, Edition 3.2. IEC 60601-2-332010+AMD12013+AMD22015 CSV 2015.