Bart R. Steensma1, Janot P. Tokaya2, Peter R. S. Stijnman1, M. Arcan Erturk3, Cornelis A. T. van den Berg1, and Alexander J. E. Raaijmakers4
1Center for Image Sciences - Computational Imaging Group, University Medical Center Utrecht, Utrecht, Netherlands, 2TNO, Utrecht, Netherlands, 3Medtronic, Minneapolis, MN, United States, 4Biomedical Engineering - Medical Imaging Analysis, Eindhoven University of Technology, Eindhoven, Netherlands
Synopsis
The effect of transmit
frequency on the risk of RF heating for elongated metallic implants was
investigated through simulations in a phantom and a human model for 21, 64, 128
and 300 MHz. We demonstrate that for uniform E-field exposure, worst-case
E-field enhancement at the tip reduces with increasing transmit frequency.
However, for realistic E-field exposures, E-field enhancement increases with
transmit frequency for similar B1+ levels. For similar head SAR levels, E-field
enhancement for worst-case implant length is roughly equal for all transmit frequencies. In all cases implant length is the main determinant of RF heating.
Introduction
Ultrahigh field MRI is
rapidly progressing towards clinical application1. Implant safety at these field strengths is
mostly unexplored territory. Most implants that are considered safe or
conditional at 1.5T and 3T are considered unsafe at 7T2. Vice versa, scanners operating at low field
(e.g. 0.5T) are considered less susceptible to implant heating3. In all cases, elongated metallic structures
such as the leads of active implantable medical devices (AIMDs) are at risk of
RF heating. These structures can cause local tissue heating as a result of RF
induced currents, which cause E-field enhancement around the tip of the implant
resulting in heating4–6. Incident electric fields from the coil, the
implant length compared to the wavelength and tissue loading all depend on the
transmit frequency and can have a strong impact on the magnitude of RF heating7,8. However, there is a general lack of knowledge
on how these parameters affect RF heating. Therefore, we performed a simulation
study on the effect of transmit frequency on RF heating of metallic implants. Methods
Electromagnetic
simulations were done in Sim4Life (Zurich Med Tech, Zurich, Switzerland). Simulations
were performed at transmit frequencies of 21, 64, 128 and 298 MHz.
First,
31 straight copper wires of various lengths (Ø = 2.0 mm, L = 3.0-44.0 cm) were simulated with
and without a 4 mm thick insulation
layer (εr = 2.2, σ = 0.0
S/m). The wires were placed inside a medium with electrical properties
resembling human tissue at 64 MHz (εr = 78, σ = 0.47 S/m). Electric fields were generated in
the phantom with uniform plane wave excitation, with a linearly increasing
phase along the wire.
To generate realistic
E-field exposures, human model Duke (virtual family9) was positioned with the head in the isocenter
of the RF coil. At 21-128MHz, a body-coil (Philips Ingenia, Philips Healthcare,
Best, The Netherlands) was used while at 7T a head-coil was used (Nova Medical, Wilmington, USA). For 4 different
wire lengths (5, 15, 30 and 60cm, insulated and non-insulated), transfer
functions were determined based on simulations with and without the wire
present10,11. Using simulated electric fields in the human
model without the implant, the induced current at the implant tip can be
predicted as12:
$$I_{tip}=TF*E_{tan}$$
With
Etan the incident electric field tangential to the wire direction
and TF the transfer function. Tip currents were calculated for all wire lengths
and possible positions inside Duke and oriented along the z-direction. Tip
currents were used as a proxy for RF heating, since electric fields are caused
by charge accumulation which scales with the current magnitude shortly before
the tip. Additionally, 10.000 clinically relevant deep brain stimulator (DBS) trajectories (length 30cm and 60cm) were
defined inside the brain and again induced current at the tip was calculated. The
method13 for defining the DBS trajectories, and two exemplary trajectories, are shown
in figure 2. The DBS trajectories
resulting in the highest tip current were imported into Sim4Life to simulate
SAR as a final verification. Results
Results of uniform
electric field exposure inside a phantom are shown in
figure 3. These results indicate that maximum heating occurs for wire lengths
where resonance takes place, which is shorter for larger frequencies. Under
these circumstances, the field enhancement at resonance actually increases with
decreasing transmit frequency.
However, results for human
model simulations show a different picture (figure 4). Here the
distribution of tip currents over the investigated wire positions is
illustrated by violin plots. When normalizing to B1+,
induced current generally goes up with transmit frequency, especially for
shorter straight wires (5-15 cm). When normalizing to head SAR, no obvious
trend is visible in the results. The tip current for the worst case wire length
of that frequency is roughly equal between field strengths, albeit that this
worst case length is shorter for larger field strengths. To verify these results
based on transfer functions and tip currents, figure 5 shows the actual SAR
distributions and peak SAR values for the 60cm implants that were expected to
cause the highest induced tip current. These results confirm that the highest
SAR occurs at 64 MHz when normalizing to head SAR, as expected from the
transfer function calculations.Discussion
Phantom results
indicate that the magnitude of the scattered E-fields around an implant at
resonance length is larger for low transmit frequencies. We hypothesize this is
because lower frequencues provide less loading and resonance at a larger length provides more length to collect energy, results in higher voltage over the wire. However, incident E-field
distributions are strongly dependent on the transmit frequency and the RF coil.
For brain imaging in commonly used RF coils with implants, when normalizing to
B1+, RF heating may in general increase with transmit
frequency. However, when operating at the head SAR limit, RF heating is similar
if the implant approaches its resonance length. Conclusion
For uniform incident
E-field exposure, expected RF heating for implants at worst-case length
decreases with increasing transmit frequency. For realistic E-field exposures, the
risk of RF heating increases with transmit frequency for similar B1+ in the brain. For similar
head SAR, RF heating at worst-case implant length is roughly equal at
each field strength.
Acknowledgements
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