Michael Childers1 and Shiloh Sison2
1Abbott, Sylmar, CA, United States, 2Abbott, Sunnyvale, CA, United States
Synopsis
As part of the MR safety assessment for AIMDs per ISO/TS 10974,
an evaluation for gradient induced device heating must be performed. For this evaluation,
the temperature response of the device is assumed to be proportional to the
square of dB/dt rms. While this has been shown to be true for
simple structures like a conductive disk, no testing has been presented showing
that this relationship is still valid for more complex AIMDs structures. In this abstract we therefore provide testing,
on a representative AIMD, confirming gradient induced device heating for AIMDs
is proportional to the square of dB/dt rms.
Introduction
For the assessment of MR
conditional safety of Active Implantable Medical Devices (AIMD) there are many
hazards to consider. One hazard, identified in ISO/TS 10974, is gradient
induced device heating. The imaging
gradient dB/dt field can induce eddy
currents on conductive surfaces of an AIMD resulting in device heating.
To test for gradient field induced device
heating per ISO/TS 10974, the temperature response of the device is assumed to
be proportional to the square of dB/dt rms1. While this has been
shown to be true for simple structures like a conductive disk, no testing has been
presented which shows that this relationship is still valid when applied to
more complex structures like AIMDs containing a large variety of materials and
shapes.
In this abstract we therefore look
to evaluate the relationship between MRI gradient induced device heating and
the time varying gradient magnetic field (dB/dt rms) for a representative AIMD.Methods
MR gradient induced device heating
testing was performed on an implantable cardiac defibrillator (ICD). An ICD is
a representative AIMD as it contains a battery and internal circuity housed
within a hermetically sealed enclosure. Gradient induced device heating testing
was performed using the methods specified in the gradient heating clause of
ISO/TS 10974 as described below.
Fiber optic temperature probes were
placed on the device surface at locations known to produce the highest heating
(i.e. the device hotspot) along with 1 ambient probe placed near the edge of
the test phantom to monitor background temperature changes. The approximate temperature probe placements
on the device under test are shown in Figure
1.
These temperature probes were used to monitor
and record the devices temperature response throughout the test exposures with
temperature measurements being recorded at least once every second.
For testing, the device was placed
in a phantom filled with HEC gel with its major conductive surfaces orthogonal
to the gradient field in order to maximize the effect of gradient heating. Using
a research gradient magnetic field generator, the device was exposed to a pulsed
gradient magnetic field using a sine waveform with a frequency of 1750Hz for a
total of 15 minutes per exposure.
The device was tested five times
for the gradient magnetic field dB/dt rms field strengths shown in Table 1. Between each run the device and
surrounding gel was allowed to cool back down to room temperature before the
next test run.
For each gradient field dB/dt rms
exposure, the temperature rise of the device over the 15-minute exposure was
calculated. The temperature rises were then plotted, and a regression analysis
was performed.
Finally, the temperature rise data collected was
scaled to the maximum dB/dt rms
level of 50 T/s rms to determine the error between the measured and scaled
temperature rises. Temperature rise scaling was performed using the following
equation per ISO/TS 10974:
$$\triangle T_{scaled}=\triangle T_{measured}\left[ \frac{\frac{dB}{dt}_{rms}(scaled)}{\frac{dB}{dt}_{rms}(measured)}\right]^{2}$$Results
The device under test was exposed
to five separate gradient magnetic field exposures for the dB/dt rms values
specified in Table
1. The measured temperature rise data
(normalized for a scale between 0 and 1) for each probe/device location is
shown in Table
2
and plotted in Figure
2. A 2nd order polynomial fit (with
the linear coefficient and free term set to zero) was applied to the plotted
test data which resulted in an R2 value greater than 0.999.
The temperature rise data collected was
then scaled to the maximum dB/dt rms level of 50 T/s rms per ISO/TS 10974. As can be seen in Table 3, the error between the scaled and measured temperature rise at 50 T/s rms was
less than 5% for all measurements.
Note: Scaling for the lowest field
strength (i.e. 10 T/s rms) was not included as the temperature rise did not
meet the signal to noise ratio requirements per ISO 10974 for scaling.Discussion/Conclusions
As can be seen in Figure 2, the
temperature rise of the device with respect to dB/dt rms closely follows a 2nd order
polynomial fit. This testing thus confirms that gradient induced device heating
for typical AIMDs is proportional to the square of dB/dt rms.Acknowledgements
No acknowledgement found.References
1.
ISO/TS
10974, 2018, "Assessment of the safety of magnetic resonance imaging for
patients with an active implantable medical device" ISO, Geneva,
Switzerland, www.astm.org.