Christine M. Tarapacki1, Daniel J. Martire1, Colin M. McCurdy1, William B. Handler1, and Blaine A. Chronik1
1The xMR Labs, Department of Physics and Astronomy, Western University, London, ON, Canada
Synopsis
Determining gradient
field-induced vibration of a device typically
involves multiple measurements at discrete frequencies. This study compares
data from a frequency chirp to discrete frequencies in an effort to decrease
testing time and obtain a larger range of information. Results confirm scaled displacement obtained through discrete
frequency measurements and a frequency chirp matched for all measured
frequencies.
Introduction
Time varying gradient
fields can lead to eddy current induced vibration of conductive devices in an
MR scanner1,2. Current
ISO DTS 10974 recommends device vibration tests to be performed in an MR
environment at discrete frequencies ranging 300-1500 Hz with maximal dB/dt
exposure3. Considering vibration is scalable by dB/dt at a given
magnetic field3, a linear frequency chirp may be able to replace
discrete frequency measurements and allow for a full range of frequencies to be
sampled quickly.
Methods
Experiments were performed at 3T (Siemens Prisma, Robarts Research
Institute, Western University) using a steel disk with a 50 mm diameter and 3 mm thickness. The
disk was positioned parallel to the scanner bed on a 2.5 cm block of synthetic ballistic gelatin (10% gelatin, Clear
Ballistics, Fort Smith, AR) in a location in the bore measured to have a maximal dBy/dt
(X=0, Y=+24 cm, Z=+30 cm). A coronal pulse sequence was
used to generate 8 discrete tones at frequencies of 200-1500 Hz with gradient
amplitudes ranging from 20-75 mT/m respectively (12800 Hz sampling rate for 3.2 seconds).
In addition, the disk was also exposed to a 4.1 second linear frequency chirp
from 200 to 2000 Hz at a constant amplitude of 15 mT/m. Vibration along the y-axis was measured with a Laser Doppler
Vibrometer (OFV-505/5000,
Polytec GmbH, Germany) positioned on a tripod at the edge of the scanner bed
with the laser
reflected off a 45-degree mirror and focused perpendicular to the edge of a
steel disk (Figure 1A). To measure dB/dt, the disk was replaced by a 10-loop
Faraday probe (5 cm diameter) and all pulse sequences were repeated (Figure 1B).
All measured data (both vibration and field probe) were filtered with a
Butterworth filter to remove low and high frequency noise. Discrete
frequency data was filtered with a 100 Hz bandwidth centered around the driving
frequency and the frequency chirp
was filtered with a larger bandwidth of 100 to 2200 Hz. The peaks in the discrete frequency
data were extracted and averaged using MATLAB (2016a) and the displacement was
scaled to the measured dB/dt. The peaks from the frequency chirp were discretized into frequencies
by dividing the exposure time linearly. The displacement obtained from the
frequency chirp
was scaled to the corresponding dB/dt and compared with the discrete frequency
data. An exponential line of fit and 95% confidence interval for the displacement
data was determined using MATLAB. Results
With a constant gradient
amplitude, the dB/dt measured from a frequency chirp resulted in an increased
dB/dt with increasing frequency from 200 to 2000 Hz as shown in Figure 2. Figure
3 shows the comparison between the scaled displacement obtained from discrete
frequency measurements and a frequency chirp. All discrete frequency measurements fell
within the 95% confidence interval of the frequency chirp
showing no significant difference between the measurement methods. For
all measurements, lower frequencies resulted in a larger displacement per
dB/dt. The line of fit
for the frequency chirp matched x(f) = (5.4E4)*f -1.9 where x(f)
represents the scaled displacement in µm/(T/s) at a frequency, f, in Hz.Discussion
This
study shows both discrete frequencies and a frequency chirp can be used to measure device vibration.
By exposing devices to a large frequency
range, potential device resonance will be evident allowing for an improved understanding
of device vibration and potential safety considerations. A single chirp
can decrease testing
time and simultaneously cover the desired range of frequencies. The trade-off
is an increased uncertainty for lower frequencies exposed to dB/dt ~ 5 times
lower than the gradient maximum. Conclusion
Performing device
tests at a maximum gradient amplitude may not be necessary as the displacement is
scalable with dB/dt. A frequency chirp is beneficial to determine safe
exposure levels for MRI conditional devices as it provides more information
about device vibration within the specified frequency range.Acknowledgements
The
authors would like to acknowledge the funding received from the NSERC Industrial
Research Chairs Program, Ontario Research Fund Research Excellence Program, and
Canadian Foundation for Innovation. References
1. Tarapacki, C, et al. Comparison of Laser Doppler
Vibrometer and Accelerometer Measurements of MRI Gradient Field Induced
Vibration in Conductive Materials. ISMRM; 2017.
2. Schaefers, G, and Andreas M. Testing methods for MR safety
and compatibility of medical devices. Minimally invasive therapy & allied
technologies; 2006;15(2):
71-75.
3. ISO, DTS 10970: Assessment of the safety of magnetic
resonance imaging for patients with an active implantable medical device.
Geneva, Switzerland: International Organization for Standardization; 2016.