As a linear and time-invariant (LTI) system, the dynamic gradient system can be described by the system transfer function. While special measurement equipment like field cameras can be used to precisely determine even higher orders of the transfer function, phantom-based approaches were introduced for alternative determination without additional hardware needed. This study reports on phantom-based measurements of B0-components, which resulted in transfer functions with sufficiently high resolution for the characterization of mechanical resonances.
Experiments were performed with a spherical phantom placed inside a 3T Siemens MAGNETOM Prismafit scanner (Siemens Healthcare, Erlangen, Germany). In a prototype sequence, 12 different input gradients $$$g_{in}(t)$$$ (duration 100 – 320 µs, slew rate = 180 T/m/s) with broad spectral support were played out. The responding phases $$$\Phi_{1}(t)$$$ and $$$\Phi_{2}(t)$$$ were measured in two parallel slices at position ±16.5 mm, vertical to the input gradient direction. For each slice, a reference phase $$$\Phi_{.,ref}(t)$$$ was additionally acquired with no gradient waveforms played out by the system. The gradient system response $$$b_{out}(t)$$$ for linear GSTF components are determined as the difference in phase evolution. In contrast to that, the gradient system response $$$b_{out}(t)$$$ for the determination of B0-components can then be calculated from the sum of the phase evolution:
$$b_{out}(t)=\frac{1}{2} \cdot \frac{1}{\gamma} \cdot \frac{d}{dt}[(\Phi_{1}(t)-\Phi_{1,ref}(t))+(\Phi_{2}(t)-\Phi_{2,ref}(t))].$$
Finally, the B0-components of the transfer functions can then be calculated as:
$$H_{B_{0},k}(f)=\frac{\sum_{i=1}^N {G_{in}^{*}}_{k}^{i}(f) \cdot {B_{out}}_{k}^{i}(f)}{\sum_{i=1}^N {{G_{in}}_{k}^{i}(f)}^2},$$
where $$$k$$$ represents the direction in which the input gradient is played out. The index represents a particular triangular waveform, and $$$N$$$ the total number of input gradients. $$$G_{in}(f)$$$ and $$$B_{out}(f)$$$ are the Fourier transforms of $$$g_{in}(t)$$$ and $$$b_{out}(t)$$$.
Relevant measurement parameters were set to: TR = 5.0 s, slice thickness = 3 mm, slice positions = ±16.5 mm, flip-angle = 90°, bandwidth = 119 kHz, 40 averages. The length of the acquisition window was ~33 ms such that the GSTF featured a frequency resolution of 30 Hz. The complete acquisition of one B0-component takes about 70 min. Fig. 1 visualizes the B0-component measurement and calculation process schematically.
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