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Correction of Artifacts in Ultrahigh Field T₂^* Imaging Using a Training Model for Field Probe Based B₀ Measurements

Session Date:Monday

Program Number:3198.

Presentation Time:15:15

Room Number:Exhibition Hall

Displaying 1 - 1 of 1

Correction of Artifacts in Ultrahigh Field T2* Imaging Using a Training Model for Field Probe Based B0 Measurements